Lee, Chabum individual record
Assistant Professor
Positions:
overview

We are pursuing the research to understand fundamental principles in multidisciplinary discipline subjects and create next-generation manufacturing methods and processes by using our core knowledge in manufacturing, precision engineering, metrology, mechatronics, and optics and academia and industry experiences. Our primary academic interests are developing precision engineering-inspired approaches to manufacturing and metrology and, reciprocally, to use these approaches to better understand learning and create new knowledge in precision machine systems. We will try any possible approaches to solving the current manufacturing problems and characterizing those limits such as accuracy, precision, long-term reliability and fatigue properties, and then, we will create new manufacturing methods and processes and push its limits at the end.

selected publications
Academic Articles46
  • Wang, Z., Lin, P., Nguyen, P., Wang, J., & Lee, C. (2024). Line-edge-roughness characterization of photomask patterns and lithography-printed patterns. Precision Engineering. 88, 235-240.
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  • Wang, Y., Guo, X., Kim, J., Lin, P., Lu, K., Lee, H., & Lee, C. (2023). A single camera unit-based three-dimensional surface imaging technique. The International Journal of Advanced Manufacturing Technology. 127(9-10), 4833-4843.
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  • Chun, H., Wang, J., Kim, J., & Lee, C. (2023). Wafer particle inspection technique using computer vision based on a color space transform model. The International Journal of Advanced Manufacturing Technology. 127(11-12), 5063-5071.
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  • Park, W., Chun, H., Nguyen, P., & Lee, C. (2023). A differentially amplified Hall effect displacement sensor for positioning control of a long-range flexure stage.. Review of Scientific Instruments. 94(7), 075003.
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  • Lee, H., Kim, J., Guo, X., & Lee, C. (2023). Non-destructive Inspection System for Self-piercing Riveting in CFRP-Metal Joining Product Using Stereoscopic Method with Robotic Manipulator. International Journal of Precision Engineering and Manufacturing.
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Chapters1
  • Lee, C. (2017). Long-Range Nano-Scanning Devices Based on Optical Sensing Technology. Advanced Mechatronics and MEMS Devices II. 495-522. Springer Nature.
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Conference Papers28
  • Lee, C. (2018). Precision Cutting Tool Wear Monitoring Method by Knife-Edge Diffraction Interferometry. Volume 3: Manufacturing Equipment and Systems. 3, v003t02a026-v003t02a026.
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  • Lee, C., Tarbutton, J., & Schmitz, T. L. (2018). An investigation of cosine error for scanning probe measurements of freeform surfaces. 466-470.
  • Kirkpatrick, M. B., Tarbutton, J. A., Le, T., & Lee, C. (2016). Characterization of 3D Printed Piezoelectric Sensors. Proceedings of IEEE Sensors, 2016 IEEE SENSORS. 1-3.
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Repository Documents / Preprints2
  • Wang, Y., Guo, X., Kim, J., Lin, P., Lu, K., Lee, H., & Lee, C. (2023). A Single Camera Unit-based Three-Dimensional Surface Imaging Technique.
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patents
Patents11
chaired theses and dissertations
Email
cblee@tamu.edu
First Name
Chabum
Last Name
Lee
mailing address
3123 TAMU;
College Station, TX-Texas 77843-3123
USA