Lee, Chabum individual record
Assistant Professor
Positions:
overview

We are pursuing the research to understand fundamental principles in multidisciplinary discipline subjects and create next-generation manufacturing methods and processes by using our core knowledge in manufacturing, precision engineering, metrology, mechatronics, and optics and academia and industry experiences. Our primary academic interests are developing precision engineering-inspired approaches to manufacturing and metrology and, reciprocally, to use these approaches to better understand learning and create new knowledge in precision machine systems. We will try any possible approaches to solving the current manufacturing problems and characterizing those limits such as accuracy, precision, long-term reliability and fatigue properties, and then, we will create new manufacturing methods and processes and push its limits at the end.

selected publications
Academic Articles41
  • Chun, H., Park, W., Kim, J., & Lee, C. (2022). In-Process Cutting Temperature Monitoring Method Based on Impedance Model of Dielectric Coating Layer at Tool-Chip Interface. JOURNAL OF MANUFACTURING AND MATERIALS PROCESSING. 6(5), 97-97.
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  • Wang, Z., Lin, P., & Lee, C. (2022). Preliminary study of photomask pattern inspection by beam-shaped knife-edge interferometry. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. 77, 104-109.
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  • Lee, C., & Guo, X. (2022). Spatially resolved stereoscopic surface profiling by using a feature-selective segmentation and merging technique. SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES. 10(1), 014002-014002.
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  • Wang, Z., Chun, H., & Lee, C. (2021). Enhancement of knife-edge interferometry for edge topography characterization.. Rev Sci Instrum. 92(12), 125101-125101.
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  • Chun, H., Kim, J., Lee, C., & Kim, H. (2021). A monolithic linear motion platform driven by a piezoelectric and fluidic pressure-fed dual mechanism.. Rev Sci Instrum. 92(10), 105002-105002.
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Chapters1
  • Lee, C. (2016). Long-Range Nano-Scanning Devices Based on Optical Sensing Technology. Advanced Mechatronics and MEMS Devices II. 495-522. Springer Nature.
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Conference Papers28
  • Lee, C. (2018). Precision Cutting Tool Wear Monitoring Method by Knife-Edge Diffraction Interferometry. Volume 3: Manufacturing Equipment and Systems, Volume 3: Manufacturing Equipment and Systems. 3, v003t02a026-v003t02a026.
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  • Lee, C., & Kim, G. H. (2018). A curved surface-insensitive optical sensing technique for precision spindle health monitoring. Proceedings - 33rd ASPE Annual Meeting. 146-149.
  • Lee, C., & Kim, G. H. (2018). A curved surface-insensitive optical sensing technique for precision spindle health monitoring. Proceedings - 33rd ASPE Annual Meeting. 353-356.
  • Lee, C., Tarbutton, J., & Schmitz, T. L. (2018). An investigation of cosine error for scanning probe measurements of freeform surfaces. Proceedings - 33rd ASPE Annual Meeting. 466-470.
  • Kirkpatrick, M. B., Tarbutton, J. A., Le, T., & Lee, C. (2016). Characterization of 3D Printed Piezoelectric Sensors. 2016 IEEE SENSORS, 2016 IEEE SENSORS. 1-3.
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Repository Documents / Preprints1
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patents
Patents11
chaired theses and dissertations
Email
cblee@tamu.edu
First Name
Chabum
Last Name
Lee
mailing address
3123 TAMU;
College Station, TX-Texas 77843-3123
USA