SCHOLARS@TAMU

Kidambi, M. K., Tyagi, A., Madani, M. R., & Bayoumi, M. A. (1998). Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 17(4), 366-371.

Tyagi, A., & Bayoumi, M. A. (1994). The nature of defect patterns on integrated-circuit wafer maps. IEEE Transactions on Reliability. 43(1), 22-29.

Tyagi, A., & Bayoumi, M. A. (1992). Defect clustering viewed through generalized Poisson distribution. IEEE Transactions on Semiconductor Manufacturing. 5(3), 196-206.

Tyagi, A., & Bayoumi, M. A. (1992). Image segmentation on a 2D array by a directed split and merge procedure. IEEE Transactions on Signal Processing. 40(11), 2804-2813.

Gogri, S., Tyagi, A., Quinn, M., & Hu, J. (2022). Transaction Level Stimulus Optimization in Functional Verification Using Machine Learning Predictors. Proceedings - International Symposium on Quality Electronic Design, ISQED, 2022 23rd International Symposium on Quality Electronic Design (ISQED). 00, 71-76.

Kande, R., Crump, A., Persyn, G., Jauernig, P., Sadeghi, A., Tyagi, A., & Rajendran, J. (2022). TheHuzz: Instruction Fuzzing of Processors Using Golden-Reference Models for Finding Software-Exploitable Vulnerabilities. USENIX Security. 3219-3236.

Tyagi, A., & Bayoumi, M. A (1996). ULSI design-for-manufacturability: a yield enhancement approach. 80-89.

Maldonado, N., Andrus, G., Tyagi, A., Madani, M., & Bayoumi, M (1995). Post-processing algorithm for short-circuit defect sensitivity reduction in VLSI layouts. Proceedings of the Annual IEEE International Conference on Innovative Systems in Silicon. 288-297.

Tyagi, A., Bayoumi, M., & Manthravadi, P (1994). Yield enhancement in the routing phase of integrated circuit layout synthesis. 52-60.